General specifications: Test current (into short circuit): ±12mA (typical) Test voltage (into open circuit): ±12V (typical)
Component Support
- Bipolar transistors (NPN/PNP inc Silicon/Germanium)
- Darlington transistors (NPN/PNP)
- Enhancement mode MOSFETs (N-Ch and P-Ch)
- Depletion mode MOSFETs (N-Ch and P-Ch)
- Junction FETs (N-Ch and P-Ch). Both symmetrical and asymmetrical types.
- Enhancement IGBTs (N-Ch and P-Ch).
- Diodes and diode networks (2 and 3 lead types).
- Zener diodes (up to about 9V).
- Voltage regulators (up to about 8V).
- LEDs and bi-colour LEDs (2 lead and 3 lead types).
- Low power sensitive Triavs and Thyristors (<10ma trigger="" and="" hold="" li="">
Measurements
- BJT current gain (hFE).
- BJT base emitter voltage (Vbe).
- BJT collector leakage current.
- MOSFET on and off gate threshold voltages.
- MOSFET transconductance.
- JFET pinch-off voltage.
- JFET transconductance.
- JFET IDSS (drain current for Vgs=0)
- IGBT on and off gate threshold voltages.
- IGBT transconductance.
- Voltage regulator output voltage.
- Voltage regulator quiescent current consumption.
- Voltage regulstor drop-out voltage.
- Zener voltage.
- Diode forward voltage drop.
PC Communications
- Micro USB socket (supplied with micro USB to standard USB cable).
- Supports Windows® XP, Vista, 7, 8 and 10 (32 bit and 64 bit versions).
- Does not currently support Linux and Mac directly.
FAQs
Downloads Software installation guide (EN) Latest software and firmware package User Guide (EN) Benutzerhandbuch (DE) Data Sheet (EN)
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